Image: 2017-06/tno-team-portraits-6.jpg

Ir. Roy Bijster



Roy's research project focuses on bringing optical near-field technologies for inspection, metrology and lithography from the laboratory to industrial application by means of the meta-instrument: an instrumentation platform that can position the required near-field optical elements at extreme proximity to the sample fast and accurately. Towards realizing such an instrument, Roy is currently working on a measurement system that measures these nanometer distances by means of heat transfer and a development platform for developing these sensors. Currently there are two international patents pending related to this research.

R.J.F. (Roy) Bijster received his the B.Sc. and M.Sc. degrees in Aerospace Engineering from Delft University of Technology in 2011 and 2014, respectively. At the latter he specialized in space systems engineering and rocket propulsion systems. He graduated on the development, realization and testing of a measurement system for thrust and impulse for micropropulsion systems.

From August 2014, Roy is pursuing a Ph.D. degree in Mechanical Engineering at the Precision and Microsystems Engineering department of Delft University of Technology in collaboration with the Nano-Optomechatronic-Instrumentation (NOMI) group of the TNO Optomechatronics department.