Maarten van Es enjoys interdisciplinary collaborations and all the challenges that brings. Currently at TNO in Delft, The Netherlands, Maarten makes AFM into a versatile tool for industrial applications. Subjects he is working on are for example Sub Surface nano-imaging using Atomic Force Microscopes and the application of Atomic Force Microscopes for nano-imaging and characterization of cell structures.
Maarten has a long track record of research using Atomic Force Microscopy and in development of AFM instrumentations and methods, starting with his masters in 2003 and his PhD from 2004 to 2008 at Leiden University, The Netherlands. Much of his experience is in quantification of interactions and mechanical properties on the nanoscale, but also in imaging and combining AFM with other microscopies.