Kodai Hatakeyama started his carrier at NOMI as a scientist on Subsurface atomic force microscopy project. He is very enthusiastic on having his hands on highly sophisticated technical systems for micro/nano structures.
Dr. Kodai Hatakeyama received the master degree in Materials Science and Engineering on his thesis with the title 'Development of frequency modulated magnetic force microscopy' at Akita university, Japan in 2011. Magnetic force microscopy (MFM) is widely used for high spatial resolution imaging of magnetic stray fields, by means of a magnetic tip mounted on a cantilever. The frequency bandwidth of MFM was limited at around a resonance frequency of the cantilever. He extended the bandwidth up to the limit of optical beam deflection setup measures the cantilever deflection, by means of frequency modulation in the cantilever oscillation. In 2016, he received the PhD degree in Micro Electromechanical systems with the title 'Challenges of scanning Hall microscopy using batch fabricated probes' at the University of Twente, Enschede. Similar to MFM, Scanning Hall probe microscopy (SHPM) is a widely used technique for high resolution imaging of magnetic stray fields. However, in contrast to MFM, SHPM is quantitative and calibration is performed in uniform fields. Scanning Hall probes with nano-meter spatial resolution have only been realized by electron beam lithography, which is a slow and expensive fabrication technique. In the thesis, he employed corner lithography to enable batch fabrication of high resolution probes in close collaboration with SmartTip B.V., addressed three challenges: mechanical fragility, magnetic sensitivity and topographic cross-talk.