Invited Lectures

  1. Maturova, K. (2017). MaskModification. In The 19th International Scanning Probe Microscopy Conference (ISPM). Kyoto, Japan.
  2. Sadeghian, H. (2017). High throughput parallel SPM and automatic tip exchange. In The 19th International Scanning Probe Microscopy Conference (ISPM). Kyoto, Japan.
  3. Herfst, R. (2017). SPM technology for metrology solutions: meeting the semiconductor industry’s throughput and application demand. In Metro450’s 5th Annual Conference for Semiconductor Metrology. Retrieved from
  4. Heiden, M. van der. (2016). Nano-optical bio-sensing. In ERP Organ-on-a-Chip dissemination workshop.
  5. Heiden, M. van der. (2016). ERP Organ-on-a-Chip dissemination workshop. In NanoBio Surfaces and Interfaces in Healthcare and Science Workshop.
  6. Sadeghian, H. (2017). High-throughput, parallel atomic force microscope. In 2nd International Nanotechnology Conference & Expo. Dubai, UAE. Retrieved from
  7. Sadeghian, H. (2016). Scanning probe microscopy and vibration isolation. In Prof-meets-CTO: meten op nanoschaal. Leiden, The Netherlands. Retrieved from Prof meets CTO v2.pdf
  8. Sadeghian, H. (2016). High Throughput parallel AFM. In 13th International Workshop on Nanomechanical Sensing. Delft, The Netherlands: NMC 2016. Retrieved from
  9. Sadeghian, H. (2016). Scanning Probe Microscope as a Lab on an Instrument for Industrial application. In 3rd Thermal Probe Workshop (Co-organized by SwissLitho and IBM Research Zurich). Retrieved from
  10. Sadeghian, H. (2015). Probing the Interactions at Nano-scale with the Use of Nano-Opto-Mechanical Instruments (NOMI). In NanoCity 2015. Amersfoort, The Netherlands. Retrieved from
  11. Roozeboom, F. (2015). Plasma etching, from “bulky” to atomic layer etch precision. In Workshop on Processing for Quantum Computing. Delft, The Netherlands.
  12. Frijters, C., Bolt, P.-J., Poodt, P., Roozeboom, F., & Illiberi, A. (2016). Spatial ALD of Zn(O,S) Buffer Layers for CIGS Solar Cells. In Novel High-k Application Workshop. Dresden, Germany.
  13. Bäumer, S. M. B., Es, M. H. van, Gerini, G., Sadeghian, H., & Silvestri, F. (2015). Meta-Instrument for Super-resolution imaging’. In High Tech System Event. Den Bosch, The Netherlands.
  14. Roozeboom, F. (2016). Perspectives of Atomic Layer Etching and related processing. In Novel High-k Application Workshop. Dresden, Germany.
  15. Sadeghian, H. (2015). Nanomechanical Sensors with Industrial Applications. In International Conference on Sensors Engineering and Electronics Instrumental Advances SEIA’ 2015. Dubai, UAE.
  16. Roozeboom, F. (2016). New options in advanced atomic layer processing. In University College Cork Seminar. Cork, Ireland.
  17. Sadeghian, H. (2016). Scanning Probe Microscopy for Industrial Application. In 3rd Thermal Probe Workshop. Zürich, Switzerland.